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Potential yield simulated by global gridded crop models: using a process-based emulator to explain their differences
Bruno Ringeval*, Christoph Müller, Thomas A.M. Pugh, Nathaniel D. Mueller, Philippe Ciais, Christian Folberth, Wenfeng Liu, Philippe Debaeke, Sylvain Pellerin
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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