Advanced aging failure model for overhead conductors

Wilson A. Vasquez, Dilan Jayaweera, Jesús Játiva-Ibarra

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)
868 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Advanced aging failure model for overhead conductors'. Together they form a unique fingerprint.

Engineering & Materials Science