Plasma defect-engineering of bulk oxygen-deficient zirconia

Ben Dashtbozorg, Fangzhou Shi*, Alberto Tagliaferro, Stephen Abela, Lucian Falticeanu, Hanshan Dong

*Corresponding author for this work

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Abstract

Oxygen-deficient zirconia (ZrO2-x) has recently emerged as a promising material for light absorption and photocatalytic applications. However, the economic and environmentally friendly manufacture of bulk ZrO2-x remains challenging and has limited widespread adoption. In this study, we present a novel low-pressure (300 Pa) plasma treatment (H2 gas at 500 °C for 5 h) capable of producing fully-dense bulk ZrO2-x without significant structural modifications. EPR (electron paramagnetic resonance) and XPS (X-ray photoelectron spectroscopy) characterisation of the plasma treated zirconia indicate the formation of Zr3+ ions and F2+ (V0) centres. The increase of oxygen vacancies is also supported by the greater exothermic heat flow and relative mass gain observed through TGA (thermogravimetric analysis) and DSC (differential scanning calorimetry) analyses. Diffuse reflectance spectroscopy (DRS) reveals a substantial enhancement in light absorption, with an average increase of 66.2 % and >65 % absolute absorption across the entire spectrum (200–3000 nm). XPS and DRS measurements suggest significant reduction in both direct (from 4.84 to 2.61 eV) and indirect (from 3.19 to 1.45 eV) bandgap transition. By effectively enhancing the light absorption capability, reducing bandgap transitions, and maintaining the structural integrity of zirconia, low-pressure plasma treatments offer a promising and scalable approach for the environmentally friendly production of next-generation ZrO2-x materials.
Original languageEnglish
Article number119457
Number of pages13
JournalActa Materialia
Volume262
Early online date21 Oct 2023
DOIs
Publication statusPublished - 1 Jan 2024

Bibliographical note

One of the authors, F.S, would also like to thank the studentship from the Centre for Doctoral Training in Innovative Metal Processing (IMPaCT) funded by EPSRC, UK (EP/F006926/1). The authors would also like to thank Dr. Hailiang Liao from the Division of Physical Sciences and Engineering at the King Abdullah University of Science and Technology for the XPS measurements of this study.

Keywords

  • Yttria-stabilized zirconia polycrystal
  • Low-pressure plasma
  • Electron paramagnetic resonance
  • X-ray photoelectron spectroscopy (XPS)
  • Optical spectroscopy

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